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动车组电缆终端内部绝缘老化的局放特性研究

Research on Partial Discharge Characteristics of Internal Insulation Aging for EMU Cable Terminals

  • 摘要: 动车组电缆终端因结构复杂及安装过程中的潜在缺陷,易在电、热、力联合作用下发生局部放电,导致绝缘老化甚至故障,严重影响列车运行安全。针对动车组电缆终端内部绝缘老化缺陷的局部放电特性展开研究,首先通过多物理场耦合仿真与试验验证相结合的方法,探究绝缘劣化机理与局放特征演变规律;其次构建电缆终端电场-热场、热场-力场耦合模型,分析典型缺陷对多物理场分布的影响,发现电场在屏蔽层、应力管及绝缘管交界处集中,温度梯度导致不同材料层收缩差异形成气隙,易引发局部放电;然后搭建冷热循环与工频电压联合老化平台,采用高频脉冲电流法监测不同老化周期的局部放电参数,明确缺陷从微缺陷形成、稳定扩展到贯通性失效的渐进过程;最后基于电缆终端内部缺陷的“缺陷扩展-放电增强-绝缘劣化”演化逻辑,通过局放参数及谱图特征来有效表征缺陷类型与老化程度,为动车组电缆终端绝缘状态评估与故障预警提供理论基础与实验依据。

     

    Abstract: Due to the complex structure of onboard cables of high-speed electric multiple units(EMU) and potential defects during installation, partial discharges are prone to occur under the combined action of electrical, thermal, and mechanical stresses, leading to insulation aging or even failures, which seriously affect the safe operation of trains. This paper focuses on the partial discharge characteristics of internal insulation aging defects in EMU cable terminals. It first explores the insulation degradation mechanism and the evolution law of partial discharge characteristics through a combination of multi-physics field coupling simulation and experimental verification. Then, it constructs coupled models of the electric-thermal field and thermal-mechanical field of cable terminals, and analyzes the impact of typical defects on the distribution of multi-physics fields. It is found that the electric field concentrates at the junctions of the shielding layer, stress tube, and insulating tube, and temperature gradients cause differences in shrinkage between different material layers, forming air gaps that easily trigger partial discharges. Furthermore, it builds a combined aging platform of thermal cycling and power frequency voltage, and uses the high-frequency pulse current method to monitor partial discharge parameters at different aging cycles, clarifying the progressive process of defects from the formation of micro-defects, stable expansion to through-failure. Finally, based on the evolution logic of "defect expansion-discharge enhancement-insulation degradation" for internal defects in cable terminals, it effectively characterizes defect types and aging degrees through partial discharge parameters and spectrum characteristics, providing a theoretical basis and experimental evidence for the insulation state assessment and fault early warning of EMU cable terminals.

     

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